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"This project aims to develop test strategies for mixed-signal/radio-frequency (RF) integrated devices using machine learning. The proposed efforts will be directed to two main areas, namely (a) the on-line test of mixed-signal/RF circuits when they are embedded in a System-on-Chip (SoC) or a System-in-Package (SiP) that demands high reliability and (b) the testing of RF micro-electro-mechanical ...
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