Machine Learning-Based Test Solutions for Reliable.. (MLTSRMSRFID)
Machine Learning-Based Test Solutions for Reliable Mixed-Signal/RF Integrated Devices
(MLTSRMSRFID)
Start date: Nov 1, 2007,
End date: Oct 31, 2011
PROJECT
FINISHED
"This project aims to develop test strategies for mixed-signal/radio-frequency (RF) integrated devices using machine learning. The proposed efforts will be directed to two main areas, namely (a) the on-line test of mixed-signal/RF circuits when they are embedded in a System-on-Chip (SoC) or a System-in-Package (SiP) that demands high reliability and (b) the testing of RF micro-electro-mechanical systems (MEMS). The key novelty of this interdisciplinary project lies in the amalgamation of concepts from machine learning with state-of-the-art practices in very large-scale integration (VLSI) design and test, in order to address emerging and open-ended test challenges."
Get Access to the 1st Network for European Cooperation
Log In