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This project aims to increase European Integrated Circuits (IC) quality and competitiveness by developing generic test instruments and interfaces which will drasticly improve the testability and reliability of ICs.Presently, production testing of ICs is done by large and expensive Automated Test Equipment (ATE). A disadvantage of this approach is that while the production cost of a transistor decr ...

... level of electronic devices, increasingly makes difficult and complicate development and testing process of devices. Enterprises of electronic industry in worldwide more and more approve innovative JTAG Boundary – scan testing technology that complies with IEEE standard 1149.1. Therefore there is necessity for qualified specialists in the field of modern electronic equipment design and testing.T ...